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Showing posts with label Ondemand. Show all posts
Showing posts with label Ondemand. Show all posts

Saturday, 4 February 2012

On-demand webcast: DC Parametric Measurements: Back to Basics - Part 1

DC parametric measurementsOverview:

This is the first of a series of two web seminars on the basics of accurate, repeatable DC Parametric measurements. Attendees will learn about DC Parametric measurement terminology, Source Measure Units (SMUs), triaxial cable basics and SMU Kelvin connection basics. We'll also discuss tips and techniques on how to make low level DC Parametric measurements using Agilent Technologies SMU's and CV measurement instrumentation. Finally, we'll provide an insight on when and how to use an SMU in preference to a Ground Unit connection (GNDU).


Who should view this web seminar:

This web seminar would be of interest to a wide audience of engineers, scientists, educators and undergraduate students working in different fields, such as semiconductor characterization and modeling, device reliability, component test, failure analysis, and nanotechnology.


Related product information:

Prices shown are list prices and are subject to change without notice.

View the original article here

On-demand webcast: Ubiquitous Test with LXI Instrumentation

Why this Webcast is important:
In our global society we continue to become more and more connected to each other and information. The basis or foundation of our global connectivity is Ethernet or LAN which is a hard wired networking standard. Today we are witnessing an explosion of low cost wireless devices that sit on the edge of LAN networks, and of handheld portable computing devices that allow us to access a LAN network from anywhere. In this presentation we will discuss how we can use these various off the shelf devices to access LXI instruments wirelessly from anywhere at any time, and some of the security tradeoffs associated with this ubiquitous access. Smart devices, smart phones and tablet PCs, and cloud capabilities will be brought up as topics, and their use and benefits for controlling and monitoring LXI instruments will be discussed.

Who should view this Webcast:
Engineers, scientists, or technicians performing long-term, long distance, or distributive testing and/or monitoring applications. Additionally, anyone that needs ubiquitous access to their instrumentation.

Prices shown are list prices and are subject to change without notice.

View the original article here

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